for switching simulation with the Charge Extraction Model PCIM 2014, Nürnberg 87 Wigger, D., Eckel, H.-G. Influence of the charge distribution on the electrical behavior of the BIGT PCIM 2014, Nürnberg 86 [...] Analysis of the SI-SIDO Boost-buck-Boost Converter during the Continuous Switching Method PCIM Europe 2025 268 Scheel, T., Tomforde, L., Eckel, H.-G. Method to Fit a HV-IGBT TCAD-Model to Match the Switching [...] H.-G. Effect of the miller-capacitance during turn-off of IGBTs at different temperatures ISPS 2012, Prag 61 Appel, T., Eckel, H.-G. Reverse Recovery Behavior of the Body Diode of the SiC MOSFET PCIM Europe
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